Keyence International

  www.keyence.com
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LR-Z Series

This laser sensor stands out for its detection stability, simple operation and robustness.

IM-6600: the IM Series Extends its Field of Applications.

By drastically reducing measurement times, Keyence's IM Series Image Dimension Measurement System has revolutionised full-part inspection. Now with a twice as large field of view (200 × 100 mm) and new illumination options, it can handle larger and more complex targets.

XG-8000

With this new series, Keyence introduces a new line scan camera. Contrary to the existing models on the market, programming is much easier.

Advanced control with vision system accessible to all

There is something new in vision systems! The new CV-X100 Series allows an end-user to easily implement complex inspection functions without the assistance of an expert. Automated measurements, auto-teaching and lens distortion or angled camera effects removal are just a few of the innovative features of the CV-X Series.

GL-R

This new series has been designed to address the problems users are having with safety light curtains. Unique and strong design, quick and easy installation, and yet the highest level of security is provided

LJ-V

This new profile measuring instrument is a real technological breakthrough. Being approximately 30 times faster than the best standard of the market, with the LJ-V Series it is possible to check instantaneously the results of a scanned target using a 3D view on line. It is also characterized by the simplicity of its implementation, its precision and its stability of detection.

VHX-2000

With this new series, Keyence takes another step ahead in the digital microscope market.

New key features for the IM series

IM-6500 is the new version of the IM series. Due to a better integration to the corporate network and with the processing software provided, it becomes possible to implement component traceability and a quality automated production management. Production drifts detection is thus immediately identifiable. The quality of measurement is also improved by new features.

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